Asian Journal of Probability and Statistics

Effect of Inspection Error on CUSUM Chart for Truncated Negative Binomial Distribution

U. Mishra *

Shri Vaishnav Vidyapeeth Vishwavidyalaya, Indore (M.P.), India.

J. R. Singh

School of Studies in Statistics, Vikram University, Ujjain (M.P.), India.

*Author to whom correspondence should be addressed.

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Abstract

  In this paper, a mathematical investigation has been done for Cumulative Sum control Chart (CSCC) of Truncated Negative Binomial Distribution (TNBD) under inspection error using the sequential probability ratio test (SPRT). Average Run Length (ARL), d (lead distance) and \(\phi\) (angle of the mask) is calculated for different values of error rates and different values of parameter of the distribution.

Keywords: TNBD, CSCC, ARL, inspection error, SPRT

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